Heading 9030
11 subheadings
Oscilloscopes, spectrum analyzers and other instruments and apparatus for measuring or checking electrical quantities, excluding meters of heading 90.28; instruments and apparatus for measuring or detecting alpha, beta, gamma, X-ray, cosmic or other ionizing radiations. - Instruments and apparatus for measuring or detecting ionizing radiations
3 tariff items
Oscilloscopes, spectrum analyzers and other instruments and apparatus for measuring or checking electrical quantities, excluding meters of heading 90.28; instruments and apparatus for measuring or detecting alpha, beta, gamma, X-ray, cosmic or other ionizing radiations. - Oscilloscopes and oscillographs
1 tariff items
Oscilloscopes, spectrum analyzers and other instruments and apparatus for measuring or checking electrical quantities, excluding meters of heading 90.28; instruments and apparatus for measuring or detecting alpha, beta, gamma, X-ray, cosmic or other ionizing radiations. - Other instruments and apparatus, for measuring or checking voltage, current, resistance or power (other than those for measuring or checking semiconductor wafers or devices): - Multimeters without a recording device
1 tariff items
Oscilloscopes, spectrum analyzers and other instruments and apparatus for measuring or checking electrical quantities, excluding meters of heading 90.28; instruments and apparatus for measuring or detecting alpha, beta, gamma, X-ray, cosmic or other ionizing radiations. - Other instruments and apparatus, for measuring or checking voltage, current, resistance or power (other than those for measuring or checking semiconductor wafers or devices): - Multimeters with a recording device
1 tariff items
Oscilloscopes, spectrum analyzers and other instruments and apparatus for measuring or checking electrical quantities, excluding meters of heading 90.28; instruments and apparatus for measuring or detecting alpha, beta, gamma, X-ray, cosmic or other ionizing radiations. - Other instruments and apparatus, for measuring or checking voltage, current, resistance or power (other than those for measuring or checking semiconductor wafers or devices): - Other, without a recording device
2 tariff items
Oscilloscopes, spectrum analyzers and other instruments and apparatus for measuring or checking electrical quantities, excluding meters of heading 90.28; instruments and apparatus for measuring or detecting alpha, beta, gamma, X-ray, cosmic or other ionizing radiations. - Other instruments and apparatus, for measuring or checking voltage, current, resistance or power (other than those for measuring or checking semiconductor wafers or devices): - Other, with a recording device
1 tariff items
Oscilloscopes, spectrum analyzers and other instruments and apparatus for measuring or checking electrical quantities, excluding meters of heading 90.28; instruments and apparatus for measuring or detecting alpha, beta, gamma, X-ray, cosmic or other ionizing radiations. - Other instruments and apparatus, specially designed for telecommunications (for example, cross-talk meters, gain measuring instruments, distortion factor meters, psophometers)
1 tariff items
Oscilloscopes, spectrum analyzers and other instruments and apparatus for measuring or checking electrical quantities, excluding meters of heading 90.28; instruments and apparatus for measuring or detecting alpha, beta, gamma, X-ray, cosmic or other ionizing radiations. - Other instruments and apparatus: - For measuring or checking semiconductor wafers or devices (including integrated circuits)
1 tariff items
Oscilloscopes, spectrum analyzers and other instruments and apparatus for measuring or checking electrical quantities, excluding meters of heading 90.28; instruments and apparatus for measuring or detecting alpha, beta, gamma, X-ray, cosmic or other ionizing radiations. - Other instruments and apparatus: - Other, with a recording device
1 tariff items
Oscilloscopes, spectrum analyzers and other instruments and apparatus for measuring or checking electrical quantities, excluding meters of heading 90.28; instruments and apparatus for measuring or detecting alpha, beta, gamma, X-ray, cosmic or other ionizing radiations. - Other instruments and apparatus: - Other
2 tariff items
Oscilloscopes, spectrum analyzers and other instruments and apparatus for measuring or checking electrical quantities, excluding meters of heading 90.28; instruments and apparatus for measuring or detecting alpha, beta, gamma, X-ray, cosmic or other ionizing radiations. - Parts and accessories
1 tariff items
Oscilloscopes, spectrum analysers and other instruments and apparatus for measuring or checking electrical quantities, excluding meters of heading9028; instruments and apparatus for measuring or detecting alpha, beta, gamma, X-ray, cosmic or other ionising radiation In accordance with general rule 3(b) for the interpretation of the Combined Nomenclature, instruments and apparatus which can be...
Source: eu_cn_en (EUR-Lex 02019XC0329(02)-20250113)
Oscilloscopes and oscillographs This subheading includes light-beam and UV-beam oscillographs for measuring and recording rapid variations of electrical quantities. These instruments, also known as light-beam recorders, UV recorders or loop oscillographs, record the signals produced by the periodic phenomenon under study by means of a light or UV beam on photosensitive paper.
Source: eu_cn_en (EUR-Lex 02019XC0329(02)-20250113)
Other, with a recording device This subheading includes electrical testing devices or systems which determine the serviceability of printed circuits or other electronic components and display any defects such as short circuits or breaks by measuring or checking electrical quantities like capacitance, inductance, impedance, resistance and voltage. These devices or systems usually comprise a...
Source: eu_cn_en (EUR-Lex 02019XC0329(02)-20250113)
For measuring or checking semiconductor wafers or devices This subheading covers electrical testing devices or systems which measure or check electrical quantities such as voltage, frequency, etc., to determine the serviceability of wafers, chips and other semiconductor devices and to display any defects such as deviations from previously set values. The devices or systems usually comprise a...
Source: eu_cn_en (EUR-Lex 02019XC0329(02)-20250113)
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