Tariff Schedule Rulings D-Memoranda Trade Remedies PGA Requirements Sanctions Regimes

Subheading 9031.41

Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors. - Other optical instruments and appliances: - For inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits)

1 tariff line items

HS Code Description MFN Duty Pref. Rate UoM
9031410000 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors. - Other optical instruments and appliances: - For inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits) Free CCCT, LDCT, GPT, UST, MXT, CIAT, CT, CRT, IT, NT, SLT, PT, COLT, JT, PAT, HNT, KRT, CEUT, UAT, CPTPT, UKT: Free NMB

Ready to classify faster?

CustomsLogIQ uses this tariff data to power AI classification. Try it now.

Try CustomsLogIQ