Zolltarif Entscheidungen D-Memoranden Handelsschutzmaßnahmen PGA-Anforderungen Sanktionsregime

Subheading 9031.41

Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors. - Other optical instruments and appliances: - For inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits)

1 tariff line items

HS-Code Beschreibung MFN-Zoll Pref.-Satz ME
9031410000 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors. - Other optical instruments and appliances: - For inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits) Free CCCT, LDCT, GPT, UST, MXT, CIAT, CT, CRT, IT, NT, SLT, PT, COLT, JT, PAT, HNT, KRT, CEUT, UAT, CPTPT, UKT: Free NMB

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