関税スケジュール 裁定 D-メモランダ 貿易救済措置 PGA要件 制裁体制

Subheading 9031.41

Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors. - Other optical instruments and appliances: - For inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits)

1 tariff line items

HSコード 説明 MFN税率 優遇税率 単位
9031410000 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors. - Other optical instruments and appliances: - For inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits) Free CCCT, LDCT, GPT, UST, MXT, CIAT, CT, CRT, IT, NT, SLT, PT, COLT, JT, PAT, HNT, KRT, CEUT, UAT, CPTPT, UKT: Free NMB

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